主要特性與技術(shù)指標(biāo)

測(cè)量能力

? 支持雙通道配置

? 最小電源分辨率：1 pA/1 μV，最小測(cè)量分辨率： 100 fA/100 nV

? 輸出：210 V、3 A 直流/10.5 A 脈沖

? 任意波形發(fā)生器和 20 μs 間隔的數(shù)字轉(zhuǎn)化能力

一般特性

? 綜合的 4 象限電源和測(cè)量能力

? 4.3 英寸彩色顯示屏支持圖形和數(shù)字顯示模式

? 免費(fèi)的應(yīng)用軟件有助于基于 PC 儀器的控制

? 高吞吐量和 SCPI 命令支持傳統(tǒng) SMU 命令集

描述

Keysight B2902A 精密型電源/測(cè)量單元（SMU）作為雙通道、結(jié)構(gòu)緊湊經(jīng)濟(jì)高效的臺(tái)式 SMU，能夠輸出和測(cè)量電壓和電流?？奢p松地執(zhí)行 I/V（電流 vs 電壓）高精度測(cè)量。綜合 4 象限電源和測(cè)量能力無(wú)需配置多個(gè)儀器即可輕松便捷地進(jìn)行 I/V 測(cè)量。一臺(tái)儀器即可提供廣泛的 210 V、3 A 直流/10.5 A 脈沖，從而將用戶(hù)的投資成本降至。最小的 100 fA/100 nV 測(cè)量分辨率可精確表征被測(cè)件。超大 4.3 英寸彩色顯示屏和各種顯示模式采用直觀操作，大大提高了測(cè)試、調(diào)試和表征的效率。

Main features and technical indicators

Ability to measure

? support for dual-channel configuration

? minimum power resolution: 1 pA/1 V, minimum measurement resolution: 100 fA/100 nV

? maximum output: 210 V, 3 A dc /10.5 A pulse

? digital conversion capability with arbitrary waveform generator and 20 s interval

General features

? integrated 4-quadrant power supply and measurement capabilities

? the 4.3-inch color display supports both graphical and digital display modes

? free application software to facilitate pc-based instrumentation control

? high throughput and SCPI commands support traditional SMU commａnd sets

describe

Keysight B2902A precision power/measurement unit (SMU) is a two-channel, compact, economical and efficient desktop SMU capable of output and measurement of voltage and current. High precision I/V (current vs voltage) measurements can be easily performed. Integrated 4 quadrant power supply and measurement capability can easily and conveniently carry out I/V measurement without the need to configure multiple instruments. One instrument provides A wide range of 210v, 3a dc / 10.5a pulses, thus minimizing the user's investment costs. The minimum 100 fA/100 nV measurement resolution can accurately characterize the part under test. The large 4.3-inch color display and various display modes adopt intuitive operation, which greatly improves the efficiency of testing, debugging and characterization.