為挑戰(zhàn)的系統(tǒng)設(shè)計提供信號高保真度
當前高速電路使得信號路徑檢定和BER分析的挑戰(zhàn)性進一步提高。由于的TDR帶寬、速的S參數(shù)測量功能及全面支持光學標準測試，DSA8200數(shù)字串行分析儀提供了完整的高速物理層測試平臺。

DSA8200采樣示波器概述

Provide signal high fidelity for the most challenging system design

The current high speed circuit makes the signal path verification and BER analysis more challenging. Because of the highest TDR bandwidth, the fastest S parameter measurement function and the comprehensive support of optical standard test, DSA8200 digital serial analyzer provides a complete high-speed physical layer test platform.

DSA8200 sampling oscilloscope

Provide signal high fidelity for the most challenging system design

Today's high-speed design makes channel characterization and BER performance analysis more difficult than ever.

With the highest TDR (time domain reflectometer) bandwidth, the fastest S parameter measurement, and the most comprehensive analysis tools, DSA8200 digital serial analyzer provides a comprehensive solution to network and link analysis.

function

advantages

Up to 4 real difference channels use real difference TDR excitation signals to accurately detect non-linear devices such as amplifiers.

The high-bandwidth (50 GHz) time-domain reflector decomposes the impedance discontinuity to 1mm at an incident level of 12 ps.

IConnect? Signal integrity USES integrated TDR and S parameter measurements to reduce measurement errors caused by signal degradation of test fixture.

Serial data network analysis (SDNA) reduces test costs by using an instrument for time - and frequency-domain analysis.

Accurately analyze the signal path to predict signal crosstalk and jitter and ensure reliable system operation.

Serial data link analysis (SDLA) determines the exact cause of eye closure through jitter, noise and BER analysis.

By quickly evaluating the eye-opening time of various FE/DFE equalization Settings receiver.

The remote sampling head optimizes signal fidelity and minimizes the impact of probes, cables and test fixtures by bringing the TDR head close to the device being tested.