TAP1500單端有源場效應(yīng)晶體管探頭為當(dāng)今數(shù)字系統(tǒng)設(shè)計提供了優(yōu)良的高速電氣和機械性能。

關(guān)鍵特性

優(yōu)秀的電氣性能

≥1.5 GHz探頭帶寬

<267 ps上升時間

≤1 pF輸入電容

1 M?輸入電阻

- 8v到+ 8v輸入動態(tài)范圍

- 10v到+ 10vdc輸入偏移范圍

通用的力學(xué)性能

用于探測小型幾何電路元件的小型緊湊探頭

DUT附件可以連接到0.5毫米間距的SMDs

可靠性魯棒設(shè)計

易于使用的

直接連接到示波器與TekVPI™探頭接口

在示波器顯示上提供自動縮放和讀出單元

方便地訪問示波器探頭菜單顯示探頭狀態(tài)/診斷信息，并控制探頭直流偏置

通過示波器遠(yuǎn)程控制GPIB/USB探頭

應(yīng)用程序

高速數(shù)字系統(tǒng)設(shè)計

組件設(shè)計及特性

制造工程及測試

教育研究

電壓波動高達(dá)16v的信號

1.5 GHz有源探頭用于TekVPI™探頭接口

TAP1500有源場效應(yīng)管探頭是專門為使用TekVPI™探頭接口直接連接示波器而設(shè)計的，它通過解決三個傳統(tǒng)問題，實現(xiàn)了高速信號采集和測量的保真度:

低DUT加載效果≤1 pF輸入電容和1 M?輸入電阻

多功能DUT連接連接到小的smd

將探頭的儀器帶寬保持為≤1ghz的示波器

TAP1500 Single-ended Active FET Probe provides excellent high-speed electrical and mechanical performance required for today's digital system designs.

Key features

• Outstanding electrical performance

• ≥1.5 GHz probe bandwidth

• <267 ps rise time

• ≤1 pF input capacitance

• 1 M? input resistance

• -8 V to +8 V input dynamic range

• -10 V to +10 VDC input offset range

• Versatile mechanical performance

• Small compact probe head for probing small geometry circuit elements

• DUT attachment accessories enable connection to SMDs as small as 0.5 mm pitch

• Robust design for reliability

• Easy to use

• Connects directly to oscilloscopes with the TekVPI™ probe interface

• Provides automatic units scaling and readout on the oscilloscope display

• Easy access to oscilloscope probe menu display for probe status/diagnostic information, and to control probe DC offset

• Remote GPIB/USB probe control through the oscilloscope

• Applications

• High-speed Digital Systems Design

• Component Design and Characterization

• Manufacturing Engineering and Test

• Educational Research

• Signals with Voltage Swings up to 16 V

1.5 GHz active probes for TekVPI™ probe interface

Specifically designed for use and direct connection to oscilloscopes with the TekVPI™ probe interface, the TAP1500 Active FET probe achieves high-speed signal acquisition and measurement fidelity by solving three traditional problems:

• Lower DUT loading effects with ≤1 pF input capacitance and 1 M? input resistance

• Versatile DUT connectivity for attaching to small SMDs

• Preserves instrument bandwidth at the probe tip for ≤1 GHz oscilloscopes